搜索结果

显示1525搜索结果中从 1021至1050的结果。
货品名称 销售 批次 数量 地点 开始 结束 货品价格
Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200407(1999-2000 . Mi... 611051 14 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200395(1999-2000). Mi... 611051 15 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200393(1999-2000). Mi... 611051 16 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 200mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200339(1999-2000). . Misti # TF124.Inve... 611051 17 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200079(1999-2000). . Misti # S5039,Inve... 611051 20 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200071(1999-2000). . Misti # S5038,Inve... 611051 21 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200068(1999-2000). . Misti # S5037,Inve... 611051 22 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200443(1999-2000). Mi... 611051 23 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3301 '; S/N: US36200438(1999-2000). Mi... 611051 24 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3302 '; S/N: US36200435(1999-2000). Mi... 611051 25 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3303 '; S/N: US36200423(1999-2000). Mi... 611051 26 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3304 '; S/N: US36200422(1999-2000). Mi... 611051 27 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3305 '; S/N: US36200420(1999-2000). Mi... 611051 28 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3306 '; S/N: US36200419(1999-2000). Mi... 611051 29 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3307 '; S/N: US36200418(1999-2000). Mi... 611051 30 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3308 '; S/N: US36200384(1999-2000). Mi... 611051 31 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3309 '; S/N: US36200388(1999-2000). Mi... 611051 32 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3310 '; S/N: US36200389(1999-2000). Mi... 611051 33 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3311 '; S/N: US36200383(1999-2000). Mi... 611051 34 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3312 '; S/N: US36200382(1999-2000). Mi... 611051 35 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200077(1999-2000). Mi... 611051 36 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Wide Area AFM - Hitachi 'WA1350 '; S/N: 03001(2007). . Misti # 1MET610,Inventory # 3005716900,As... 611051 37 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Slurry & Cleaning Chemical Distribution System - Celerity 'MegaFlow-VII '; (2007). Misti # 1CSS1... 611051 38 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Crystal Edge - ACCRETECH 'Crystal Edge 2.0 '; S/N: CE5002(2008). Misti # 1BEI409,Inventory # 300... 611051 39 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Wafer Inspection System - JEOL 'JWS-3000 '; S/N: WS11000006(2007). Misti ID: 1TSM404.Inventory #... 611051 40 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Wafer Inspection System - JEOL 'JWS-3000 '; S/N: WS11000005(2007). Misti # 1TSM401 Inventory # 3... 611051 41 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Bright Field Defect Inspection - ACCRETECH 'Win-Win 50 '; S/N: R00105CB-01(2007). Misti # 1DFT51... 611051 42 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Bright Field Defect Inspection - ACCRETECH 'Win-Win 50 '; S/N: R00103BB-01(2007). Misti # 1DFT51... 611051 43 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Bright Field Defect Inspection - ACCRETECH 'Win-Win 50 '; S/N: R00101BB-01(2007). Misti # 1DFT51... 611051 44 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易
Texas Instruments 300mm Bright Field Defect Inspection - ACCRETECH 'Win-Win 50 '; S/N: R00102BB-01(2007). Misti # 1DFT50... 611051 45 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
协商交易