611051 — Texas Instruments - Unique Offering of Semiconductor Design & Manufacturing Tools in AIZU, Japan- Ongoing Private Treaty

Apertura 30 March 2017 In Chiusura 31 December 2018 04:00 EST
Descrizione

Nota bene:

* Non è previsto l'accompagnamento dei clienti per l'ispezione/ Esclusivamente per appuntamento

* Non è possibile il ritiro durante il fine settimana ed i giorni festivi/ Esclusivamente per appuntamento
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Apertura Offerte 30 March 2017 21:00 ET
Data Chiusura Offerte 31 December 2018 04:00 ET
Data Assegnazione 1 January 2019 04:00 ET
Data di Scadenza Offerta December 31 @ 4AM ET
Data Ritiro Within 10 Business Days of the Date of Invoice
Orario Ritiro By Appointment Only / Call site listed for removal times
Saldare Within 3 Business Days of the Date of Invoice
Contatti 139 1795 6751 or Eric.Zhang@liquidityservices.com
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Texas Instruments 300mm Metal CVD - TEL 'TRIAS '; S/N: H10108(2002). 2 chambers. Misti # 1SPA001.Inventory # 3005703600.... 611051 1 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm CVD - AMAT 'P5000 Mark II '; S/N: 4295. 3 Chambers. Misti # CVD2020,Inventory # 3005839200,Asset... 611051 2 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm CVD - AMAT 'P5000 Mark II '; S/N: 4881. 2 Chambers. Misti # CVD2040,Inventory # 3005839400,Asset... 611051 4 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Metal Thickness Measurment Tester - Jordan Valley 'JVX 6200 '; S/N: M820(2002). Misti # 1MET609,... 611051 5 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Contact Angle Measurment Tester - Kyowa Interface Science 'Drop Master 700D '; S/N: 020-00004. M... 611051 8 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Tester - RIGAKU 'MFM65 '; S/N: DS2507N(2007). . Misti # 1MET007. Location: A2. ***Buyer acknowle... 611051 11 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200394(1999-2000). Mi... 611051 12 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200390(1999-2000 . Mi... 611051 13 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200407(1999-2000 . Mi... 611051 14 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200395(1999-2000). Mi... 611051 15 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200393(1999-2000). Mi... 611051 16 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200339(1999-2000). . Misti # TF124.Inve... 611051 17 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200079(1999-2000). . Misti # S5039,Inve... 611051 20 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200071(1999-2000). . Misti # S5038,Inve... 611051 21 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - HP 'V3300 '; S/N: US36200068(1999-2000). . Misti # S5037,Inve... 611051 22 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200443(1999-2000). Mi... 611051 23 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3301 '; S/N: US36200438(1999-2000). Mi... 611051 24 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3302 '; S/N: US36200435(1999-2000). Mi... 611051 25 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3303 '; S/N: US36200423(1999-2000). Mi... 611051 26 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3304 '; S/N: US36200422(1999-2000). Mi... 611051 27 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3305 '; S/N: US36200420(1999-2000). Mi... 611051 28 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3306 '; S/N: US36200419(1999-2000). Mi... 611051 29 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3307 '; S/N: US36200418(1999-2000). Mi... 611051 30 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3308 '; S/N: US36200384(1999-2000). Mi... 611051 31 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3309 '; S/N: US36200388(1999-2000). Mi... 611051 32 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3310 '; S/N: US36200389(1999-2000). Mi... 611051 33 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3311 '; S/N: US36200383(1999-2000). Mi... 611051 34 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3312 '; S/N: US36200382(1999-2000). Mi... 611051 35 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200077(1999-2000). Mi... 611051 36 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Wide Area AFM - Hitachi 'WA1350 '; S/N: 03001(2007). . Misti # 1MET610,Inventory # 3005716900,As... 611051 37 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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