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Mostrando 31–59 de 59 resultados de búsqueda.
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Agilent '83000 f330' Test System Frequency: 330 MHz, Vector Memory: 4M, Scan Memory: -, Digital pins: 512 located on bo... 561377 2 1 Yokneam, Israel 05/13/2018 08/31/2018 07:00AM
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Agilent '1200 Series' Column Oven Asset ID 7-32. G1316B TCC SL. Fully operational. As per photographs, used, ex-works... 561424 11 1 Berkshire (Aldermaston), United Kingdom 09/05/2018 09/12/2018 09:00AM
£0.00 GBP
HP / Agilent '6890A' GC with Twin FID. With two Agilent 7683 turrets, autosampler tray and G1369C LAN interface. Powers... 561424 30 1 Weybridge, United Kingdom 09/05/2018 09/12/2018 09:00AM
£0.00 GBP
Agilent '6890N (G1530N)' GC Tested and operational Agilent 6890N GC includes 2 split/splitless inlets and 2 x FID detect... 561424 50 1 Shinfeld, United Kingdom 09/05/2018 09/12/2018 09:00AM
£0.00 GBP
Agilent 'G1321A ' Fluorescence Detector Serviced and operational Agilent G1321A FLD. Complete with Standard FLD flow cel... 561424 51 1 Shinfeld, United Kingdom 09/05/2018 09/12/2018 09:00AM
£0.00 GBP
Agilent 'G1314A' Variable Wavelength Detector Service and operational Agilent G1314A, complete with standard flow cell.... 561424 52 1 Shinfeld, United Kingdom 09/05/2018 09/12/2018 09:00AM
£0.00 GBP
Agilent 'G1367A' Wellplate Autosampler Serviced and operational Agilent G1367A WPALS, complete with plate holder. , Ser... 561424 53 1 Shinfeld, United Kingdom 09/05/2018 09/12/2018 09:00AM
£0.00 GBP
Agilent/HP '1100 Series ' HPLC Asset ID 7-14 (6-27). Includes G1310A Pump, G1313A ALS, G1316A Colcom, G1314A Detector,... 561424 500 1 Berkshire (Aldermaston), United Kingdom 09/05/2018 09/12/2018 09:00AM
£0.00 GBP
Agilent 'U8002A' MKR-EQ003 Signal Output DC Power supply - Agilent 'U8002A', qty: 1; DC Power Supply, LGE 'GP-4185DU', q... 611016 2045 1 Seoul, Korea, Republic of (South Korea) 08/25/2015 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200394(1999-2000). Mi... 611051 12 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200390(1999-2000 . Mi... 611051 13 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200407(1999-2000 . Mi... 611051 14 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200395(1999-2000). Mi... 611051 15 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200393(1999-2000). Mi... 611051 16 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200443(1999-2000). Mi... 611051 23 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3301 '; S/N: US36200438(1999-2000). Mi... 611051 24 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3302 '; S/N: US36200435(1999-2000). Mi... 611051 25 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3303 '; S/N: US36200423(1999-2000). Mi... 611051 26 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3304 '; S/N: US36200422(1999-2000). Mi... 611051 27 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3305 '; S/N: US36200420(1999-2000). Mi... 611051 28 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3306 '; S/N: US36200419(1999-2000). Mi... 611051 29 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3307 '; S/N: US36200418(1999-2000). Mi... 611051 30 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3308 '; S/N: US36200384(1999-2000). Mi... 611051 31 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3309 '; S/N: US36200388(1999-2000). Mi... 611051 32 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3310 '; S/N: US36200389(1999-2000). Mi... 611051 33 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3311 '; S/N: US36200383(1999-2000). Mi... 611051 34 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3312 '; S/N: US36200382(1999-2000). Mi... 611051 35 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200077(1999-2000). Mi... 611051 36 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm UV-Spectro Photrometer - AGILENT '8453A '; Already dismantled. Misti # MES4030. Location: A2-1s... 611051 50 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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