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Mostrando 31–57 de 57 resultados de búsqueda.
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Agilent Dynatherm Model IACEM 980 Thermal Desorption System, SN: 33014-custom, 115AC, 50/60Hz, 8A. [CDA01Q63081001B-G091... 502073 7215 1 Richmond, KY 12/17/2018 Hoy 05:00PM
$0.00 USD
Heterodyne test set to evaluate the performance of transimpedance amplifier installed in PMQPSK optical receiver (100Gb/... 502097 1 1 Brownsville, TX 11/12/2018 01/31/2019 05:00PM
Trato Privado
Test equipment designed to perform continuity, LIV, spectrum and wavelength test for 10x10G Transmitter, it has the abil... 502097 2 1 Brownsville, TX 11/12/2018 01/31/2019 05:00PM
Trato Privado
Deflector Axial Optical Alignment and Laser Weld System, Semi-automated axial optical alignment and laser weld system ca... 502097 7 1 Brownsville, TX 11/12/2018 01/31/2019 05:00PM
Trato Privado
Pigtail Axial Optical Alignment and Laser Weld System, Semi-automated axial optical alignment and laser weld system capa... 502097 18 1 Brownsville, TX 11/12/2018 01/31/2019 05:00PM
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Agilent '7890 B (G3440B), G4514A, G4513A' GC System , Serial No. CN16363164, CN16290091, CN16260094, (11/2016)... 561463 42 1 Weiterstadt, Germany 10/13/2018 01/31/2019 09:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200394(1999-2000). Mi... 611051 12 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200390(1999-2000 . Mi... 611051 13 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200407(1999-2000 . Mi... 611051 14 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200395(1999-2000). Mi... 611051 15 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200393(1999-2000). Mi... 611051 16 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200443(1999-2000). Mi... 611051 23 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3301 '; S/N: US36200438(1999-2000). Mi... 611051 24 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3302 '; S/N: US36200435(1999-2000). Mi... 611051 25 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
Trato Privado
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3303 '; S/N: US36200423(1999-2000). Mi... 611051 26 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3304 '; S/N: US36200422(1999-2000). Mi... 611051 27 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3305 '; S/N: US36200420(1999-2000). Mi... 611051 28 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3306 '; S/N: US36200419(1999-2000). Mi... 611051 29 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3307 '; S/N: US36200418(1999-2000). Mi... 611051 30 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3308 '; S/N: US36200384(1999-2000). Mi... 611051 31 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
Trato Privado
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3309 '; S/N: US36200388(1999-2000). Mi... 611051 32 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
Trato Privado
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3310 '; S/N: US36200389(1999-2000). Mi... 611051 33 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
Trato Privado
Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3311 '; S/N: US36200383(1999-2000). Mi... 611051 34 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3312 '; S/N: US36200382(1999-2000). Mi... 611051 35 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 300mm Mixed Memory/Loic IC Test System - Agilent Technologies 'V3300 '; S/N: US36200077(1999-2000). Mi... 611051 36 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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Texas Instruments 200mm UV-Spectro Photrometer - AGILENT '8453A '; Already dismantled. Misti # MES4030. Location: A2-1s... 611051 50 1 Aizuwakamatsu-shi, Japan 03/30/2017 12/31/2018 04:00AM
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(13) Test Measurement Equipment - 1) Tektronix 'AWG2021' - Arbitrary Waveform Generator SN: J310444 , CONDITION : Workin... 611109 2 1 Bayan Lepas, Malaysia 01/20/2019 01/24/2019 03:00AM
$0.00 USD