Jeol JSM 35-CF Scanning Electron Microscope

Description: Scanning Electron Microscope Jeol JSM 35-CF, consists: 1) Scanning Electron Microscope, model: JSM 35-CF, made in Japan, S/no: EP 704055-88, EP 156095-68
2) X-Ray Spectrometer, model: FCS 4-Crystal, made in Japan, S/No: EP 387018-21
3) Chart Paper, model: XM-CR 3 from Rikadenki (RDK), S/no : PS 65643/ FS 07-3010
4) Kevex-Ray Microanalysis Instruments, model: 3203-35-VR, Det Area 10 mmsq , Det Bias -500v, resolution At 5.9 Kev, Mk IV I46cv@IKHz, Window 008 mm, S/no : N-2708
5) Kevex Unispec System come with PC set, Multi Synchronous Super VGA Colour monitor, model: 7000-77 main frame, KTM 1428, AC 90 V, 260V, 50-60 Hz, Current 1.2A max, S/no: 93m174375
6) Jeol Power Supply, model: 50A-SDT / JSM 35CF, made in Japan, S/no: EP 156095-68, EP 693078-15

Quantity: Lot of 1

Location: Singapore

Preview inspection: By prior appointment

Removal note: Buyer is subjected to storage charges if fail to pick up the purchase by the date of removal